The ICI Radiation Effects Group was recently performing low flux qualification of precision crystal oscillators at the Indiana University Cyclotron Facility (IUCF) when a massive power outage in Bloomington brought the measurements to a halt. As can be seen from some of the pictures from the trip, nothing keeps a good measurement team down!
In our continuing efforts to provide exceptional value to our clients, we have recently performed a variety of system-level SEE measurements with energetic protons in order to identify event signatures in complex system engineering units. These board and system level measurements included identifying potential targets, establishing exposure protocols and sequences to maximize data return and minimize resources required, and then analyzing the results to distinguish between competing events and cross sections. Some of the discrete components included in this measurement series included advanced GaAs ASICs, AM29116 microcontrollers, hardened CMOS SRAMs, system EDAC controllers, and various ECL level shifters and drivers. As we have previously shown in some of our other papers, such full scale system measurements are often the preferred method to quickly identify the significant event footprints that can potentially be observed within the framework of complex system interactions.
We have recently been revisiting the issue of Single Event Transients within systems. Many people spent time performing survivalbility analysis for SEUs, but the potential impact of SETs is often overlooked, sometimes with serious consequences. We have previously published papers discussing the issue of SETs in various classes of devices, and have also put together a brief presentation discussing some of the variety of phenomena and trends that might be observed. The moral of the story is that there is a rich variety of potential SET phenomena, affected by a variety of parameters.
